Li M., Xi X.X., Hellstrom E., Davidson B.A., Chen K., Acharya N., Collantes Y., Kasaei L., Manichev V., Feldman L.C., Gustafsson T., Demir M., Bhattarai P.
Rufoloni A., Vannozzi A., Kursumovic A., MacManus-Driscoll J.L., Tendeloo G.V., Pompeo N., Silva E., Torokhtii K., Meledin A., Frolova A., Armenio1 A.A., Mancini1 A., Pinto1 V., Feighan J., Celentano1 G., Rizzo1 F., Augieri1 A.
Ключевые слова: presentation, HTS, YBCO, films, films epitaxial, doping effect, nanoscaled effects, PLD process, pinning centers artificial, pinning force, density, magnetic field dependence, critical caracteristics, Jc/B curves, microstructure, defects columnar, critical current density, angular dependence, resistive transition, X-ray diffraction, temperature dependence, growth rate, experimental results
Ключевые слова: HTS, YBCO, coated conductors, MOD process, fluorine-free process, sintering, oxygenation treatments, nucleation, films epitaxial, fabrication, microstructure, Raman spectroscopy, growth rate, interfaces, critical caracteristics, Jc/B curves, critical current density, angular dependence, X-ray diffraction, phase composition, measurement technique
Ключевые слова: HTS, Bi2212, films epitaxial, MOD process, substrate SrTiO3, fabrication, X-ray diffraction, microstructure, resistive transition, critical temperature
Puig T., Palau A., Obradors X., Usoskin A., Coll M., Gazquez J., Ricart S., Li Z., Pop C., Valles F., Mundet B., Ros J., Chamorro N., Vallejo B., Pino F.
Ключевые слова: HTS, YBCO, films epitaxial, nanocomposites, nanoscaled effects, coated conductors, X-ray diffraction, microstructure, fluorine process, chemical solution deposition, nucleation, critical caracteristics, critical current density, thickness dependence, composition, Jc/B curves, temperature dependence, angular dependence, experimental results
Ключевые слова: HTS, YBCO, films epitaxial, liquid phase epitaxy, fabrication, saturation, X-ray diffraction, microstructure, growth rate, critical caracteristics, Jc/B curves
Ключевые слова: YBCO, PrBCO, X-ray diffraction, precursors, solid-state synthesis, bulk, PLD process, multilayered structures, films epitaxial, buffer layers, nanoscaled effects, substrate LaAlO3, substrate single crystal, resistive transition, resistivity, temperature dependence, thickness dependence, fabrication, experimental results
Ключевые слова: HTS, YBCO, films epitaxial, substrate SrTiO3, PLD process, fabrication, X-ray diffraction, microstructure
Ключевые слова: HTS, YBCO, films epitaxial, substrate single crystal, chemical solution deposition, buffer layers, gradient, X-ray diffraction, temperature dependence, fabrication, microstructure, critical caracteristics, Jc/B curves, pinning force, resistive transition, resistivity, experimental results
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